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Capacitance–voltage characterization of surface-treated Al2O3/GaN metal–oxide–semiconductor structures
Microelectronic Engineering
◽
10.1016/j.mee.2013.03.108
◽
2013
◽
Vol 109
◽
pp. 10-12
◽
Cited By ~ 4
Author(s):
Sung-Bum Bae
◽
Ki-Won Kim
◽
Yong Soo Lee
◽
Jung-Hee Lee
◽
Youngho Bae
◽
...
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
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References
Capacitance-Voltage Characterization of Atomic-Layer-Deposited Al2O3/InGaAs and Al2O3/GaAs Metal-Oxide-Semiconductor Structures
ECS Transactions
◽
10.1149/1.2355699
◽
2019
◽
Vol 3
(3)
◽
pp. 59-69
◽
Cited By ~ 4
Author(s):
Peide (Peter) Ye
◽
Yi Xuan
◽
H.C. Lin
Keyword(s):
Metal Oxide
◽
Atomic Layer
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Characterization of ultrathin metal–oxide–semiconductor structures using coupled current and capacitance–voltage models based on quantum calculation
Journal of Applied Physics
◽
10.1063/1.1506000
◽
2002
◽
Vol 92
(8)
◽
pp. 4449-4458
◽
Cited By ~ 19
Author(s):
O. Simonetti
◽
T. Maurel
◽
M. Jourdain
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Quantum Calculation
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Photo-assisted capacitance-voltage characterization of high-quality atomic-layer-deposited Al2O3∕GaN metal-oxide-semiconductor structures
Applied Physics Letters
◽
10.1063/1.2719228
◽
2007
◽
Vol 90
(14)
◽
pp. 143504
◽
Cited By ~ 72
Author(s):
Y. Q. Wu
◽
T. Shen
◽
P. D. Ye
◽
G. D. Wilk
Keyword(s):
Metal Oxide
◽
Atomic Layer
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
High Quality
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Capacitance–Voltage Characterization of La$_{2}$O$_{3}$ Metal–Oxide–Semiconductor Structures on In$_{0.53}$Ga$_{0.47}$As Substrate with Different Surface Treatment Methods
Japanese Journal of Applied Physics
◽
10.1143/jjap.50.10pd03
◽
2011
◽
Vol 50
(10)
◽
pp. 10PD03
◽
Cited By ~ 1
Author(s):
Dariush Zade
◽
Takashi Kanda
◽
Koji Yamashita
◽
Kuniyuki Kakushima
◽
Hiroshi Nohira
◽
...
Keyword(s):
Metal Oxide
◽
Surface Treatment
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Treatment Methods
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer
Applied Physics Letters
◽
10.1063/1.4907861
◽
2015
◽
Vol 106
(5)
◽
pp. 051605
◽
Cited By ~ 52
Author(s):
Shenghou Liu
◽
Shu Yang
◽
Zhikai Tang
◽
Qimeng Jiang
◽
Cheng Liu
◽
...
Keyword(s):
Metal Oxide
◽
Interfacial Layer
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
Download Full-text
High frequency capacitance–voltage characterization of Al2O3/ZrO2/Al2O3 in fully depleted silicon-on-insulator metal–oxide–semiconductor capacitors
Applied Physics Letters
◽
10.1063/1.1579865
◽
2003
◽
Vol 83
(25)
◽
pp. 5238-5240
◽
Cited By ~ 4
Author(s):
N. L. Zhang
◽
Z. T. Song
◽
Q. W. Shen
◽
Y. J. Wu
◽
Q. B. Liu
◽
...
Keyword(s):
Metal Oxide
◽
High Frequency
◽
Metal Oxide Semiconductor
◽
Silicon On Insulator
◽
Oxide Semiconductor
◽
Fully Depleted
◽
Capacitance Voltage
Download Full-text
Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structures
Applied Physics Letters
◽
10.1063/1.2790787
◽
2007
◽
Vol 91
(13)
◽
pp. 133510
◽
Cited By ~ 85
Author(s):
Guy Brammertz
◽
Koen Martens
◽
Sonja Sioncke
◽
Annelies Delabie
◽
Matty Caymax
◽
...
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Formation and characterization of nanometer scale metal-oxide-semiconductor structures on GaAs using low-temperature atomic layer deposition
Applied Physics Letters
◽
10.1063/1.1954902
◽
2005
◽
Vol 87
(1)
◽
pp. 013501
◽
Cited By ~ 17
Author(s):
P. D. Ye
◽
G. D. Wilk
◽
E. E. Tois
◽
Jian Jim Wang
Keyword(s):
Low Temperature
◽
Atomic Layer Deposition
◽
Metal Oxide
◽
Atomic Layer
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Nanometer Scale
◽
Semiconductor Structures
◽
Layer Deposition
Download Full-text
Some electrical properties of the GaAs-anodic oxide interface on the basis of measurements of the capacitance-voltage and conductance-voltage characteristics of metal-oxide-semiconductor structures
Thin Solid Films
◽
10.1016/0040-6090(88)90675-x
◽
1988
◽
Vol 165
(1)
◽
pp. 21-28
Author(s):
St. Łos̀
◽
St. Kochowski
Keyword(s):
Electrical Properties
◽
Metal Oxide
◽
Anodic Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Oxide Interface
◽
Semiconductor Structures
◽
Capacitance Voltage
Download Full-text
Quasi-static capacitance–voltage characteristics of pentacene-based metal–oxide–semiconductor structures
Microelectronics Journal
◽
10.1016/j.mejo.2013.02.017
◽
2013
◽
Vol 44
(7)
◽
pp. 606-611
◽
Cited By ~ 6
Author(s):
C. Ucurum
◽
H. Goebel
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Semiconductor Structures
◽
Static Capacitance
◽
Capacitance Voltage
Download Full-text
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