Micro-Raman characterization of stress distribution within free standing mono- and poly-crystalline silicon membranes

1998 ◽  
Vol 41-42 ◽  
pp. 469-472 ◽  
Author(s):  
M. Siakavellas ◽  
E. Anastassakis ◽  
G. Kaltsas ◽  
A.G. Nassiopoulos
1994 ◽  
Vol 42 (1-3) ◽  
pp. 689-694 ◽  
Author(s):  
B. Schmidt ◽  
J. von Borany ◽  
U. Todt ◽  
A. Erlebach

2011 ◽  
Vol 679-680 ◽  
pp. 141-144 ◽  
Author(s):  
Nicolò Piluso ◽  
Massimo Camarda ◽  
Ruggero Anzalone ◽  
Andrea Severino ◽  
Antonino La Magna ◽  
...  

Raman microscopy has been used to study the stress distribution on 3C-SiC/Si(100) micro-machined free standing structures. Linear scans along different structures reveal similar trends of the TO mode Raman Shift. We have found that, independently of the microstructure considered, the Raman frequency decreases close to the undercut. We compare our experimental measurements with FEM simulations finding that, close to the undercut, the stress tensor becomes non-diagonal, modifying the Raman shift to stress relation.


1980 ◽  
Vol 37 (8) ◽  
pp. 712-714 ◽  
Author(s):  
J. C. Mikkelsen ◽  
F. L. Galeener

2013 ◽  
Vol 102 (19) ◽  
pp. 192108 ◽  
Author(s):  
A. Shchepetov ◽  
M. Prunnila ◽  
F. Alzina ◽  
L. Schneider ◽  
J. Cuffe ◽  
...  

Author(s):  
Yuk L. Tsang ◽  
Alex VanVianen ◽  
Xiang D. Wang ◽  
N. David Theodore

Abstract In this paper, we report a device model that has successfully described the characteristics of an anomalous CMOS NFET and led to the identification of a non-visual defect. The model was based on detailed electrical characterization of a transistor exhibiting a threshold voltage (Vt) of about 120mv lower than normal and also exhibiting source to drain leakage. Using a simple graphical simulation, we predicted that the anomalous device was a transistor in parallel with a resistor. It was proposed that the resistor was due to a counter doping defect. This was confirmed using Scanning Capacitance Microscopy (SCM). The dopant defect was shown by TEM imaging to be caused by a crystalline silicon dislocation.


Author(s):  
Maria C. Garcia Toro ◽  
Miguel L. Crespillo ◽  
Jose Olivares ◽  
Joseph T. Graham

Nanoscale ◽  
2021 ◽  
Author(s):  
Xianghui Zhang ◽  
Andre Beyer

The discovery of graphene has triggered a great interest in inorganic as well as molecular two-dimensional (2D) materials. In this review, we summarize recent progress in the mechanical characterization of...


2016 ◽  
Vol 2016 ◽  
pp. 1-6 ◽  
Author(s):  
A. M. Espinoza-Rivas ◽  
M. A. Pérez-Guzmán ◽  
R. Ortega-Amaya ◽  
J. Santoyo-Salazar ◽  
C. D. Gutiérrez-Lazos ◽  
...  

Graphite-coated iron nanoparticles were prepared from magnetite nanoparticles by chemical vapour deposition (CVD) under methane and hydrogen atmosphere. After being purified from carbon excess, graphite-coated iron nanoparticles were tested for morphological and magnetic properties. It was found that, during the thermal process, magnetite nanoparticles 6 nm in size coalesce and transform into graphite-coated iron 200 nm in size, as revealed by scanning electron microscopy (SEM). Raman characterization assessed that high-quality graphite coats the iron core. Magnetic measurements revealed the phase change (magnetite to iron) as an increase in the saturation magnetization from 50 to 165 emu/g after the CVD process.


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