Calibration of the momentum scale of a particle physics detector using the Armenteros-Podolanski plot

P. Baladrón Rodríguez; V. Chobanova; X. Cid Vidal; V. Gligorov; M. Lucio Martínez; J. Markov; D. Martínez Santos; M. Pló Casasús

doi:10.1088/1748-0221/16/06/p06036

Calibration of the momentum scale of a particle physics detector using the Armenteros-Podolanski plot

Journal of Instrumentation ◽

10.1088/1748-0221/16/06/p06036 ◽

2021 ◽

Vol 16 (06) ◽

pp. P06036

Author(s):

P. Baladrón Rodríguez ◽

V. Chobanova ◽

X. Cid Vidal ◽

V. Gligorov ◽

M. Lucio Martínez ◽

...

Keyword(s):

Particle Physics ◽

Momentum Scale

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Microfabrication research at the National Submicron Facility

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100074331 ◽

1983 ◽

Vol 41 ◽

pp. 86-89

Author(s):

E.D. Wolf

Keyword(s):

Integrated Circuits ◽

Particle Physics ◽

High Speed ◽

New Technology ◽

High Energy ◽

High Energy Particle ◽

New Science ◽

Wide Range ◽

Intermediate Domain ◽

Circuit Function

Most microelectronics devices and circuits operate faster, consume less power, execute more functions and cost less per circuit function when the feature-sizes internal to the devices and circuits are made smaller. This is part of the stimulus for the Very High-Speed Integrated Circuits (VHSIC) program. There is also a need for smaller, more sensitive sensors in a wide range of disciplines that includes electrochemistry, neurophysiology and ultra-high pressure solid state research. There is often fundamental new science (and sometimes new technology) to be revealed (and used) when a basic parameter such as size is extended to new dimensions, as is evident at the two extremes of smallness and largeness, high energy particle physics and cosmology, respectively. However, there is also a very important intermediate domain of size that spans from the diameter of a small cluster of atoms up to near one micrometer which may also have just as profound effects on society as “big” physics.

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Indirect measurements in micro-space with the EM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100139366 ◽

1995 ◽

Vol 53 ◽

pp. 598-599

Author(s):

Sterling P. Newberry

Keyword(s):

Electron Microscope ◽

Standard Model ◽

Particle Physics ◽

Information Storage ◽

Storage Space ◽

Indirect Measurements ◽

Storage And Retrieval ◽

Adequate Information ◽

Compelling Reason ◽

The Standard Model

At the 1958 meeting of our society, then known as EMSA, the author introduced the concept of microspace and suggested its use to provide adequate information storage space and the use of electron microscope techniques to provide storage and retrieval access. At this current meeting of MSA, he wishes to suggest an additional use of the power of the electron microscope.The author has been contemplating this new use for some time and would have suggested it in the EMSA fiftieth year commemorative volume, but for page limitations. There is compelling reason to put forth this suggestion today because problems have arisen in the “Standard Model” of particle physics and funds are being greatly reduced just as we need higher energy machines to resolve these problems. Therefore, any techniques which complement or augment what we can accomplish during this austerity period with the machines at hand is worth exploring.

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Optimal Test Assembly in Practice

Zeitschrift für Psychologie ◽

10.1027/2151-2604/a000146 ◽

2013 ◽

Vol 221 (3) ◽

pp. 190-200 ◽

Cited By ~ 9

Author(s):

Jörg-Tobias Kuhn ◽

Thomas Kiefer

Keyword(s):

Particle Physics ◽

Large Scale ◽

Block Design ◽

Linear Optimization ◽

Mixed Integer ◽

Optimal Test ◽

Automated Test Assembly ◽

Test Assembly ◽

Block Level ◽

Mixed Integer Linear Optimization

Several techniques have been developed in recent years to generate optimal large-scale assessments (LSAs) of student achievement. These techniques often represent a blend of procedures from such diverse fields as experimental design, combinatorial optimization, particle physics, or neural networks. However, despite the theoretical advances in the field, there still exists a surprising scarcity of well-documented test designs in which all factors that have guided design decisions are explicitly and clearly communicated. This paper therefore has two goals. First, a brief summary of relevant key terms, as well as experimental designs and automated test assembly routines in LSA, is given. Second, conceptual and methodological steps in designing the assessment of the Austrian educational standards in mathematics are described in detail. The test design was generated using a two-step procedure, starting at the item block level and continuing at the item level. Initially, a partially balanced incomplete item block design was generated using simulated annealing, whereas in a second step, items were assigned to the item blocks using mixed-integer linear optimization in combination with a shadow-test approach.

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