Study on principle and technology of position and attitude parameters measurement system for roadheader

2011 ◽  
Author(s):  
Li Rui ◽  
Zhu Xin-Ping ◽  
Gao Juan ◽  
Wu Miao
Keyword(s):  
Measurement System ◽  
Parameters Measurement

External trigger technique of high speed signal of beam parameters measurement system under strong electromagnetic interruption

2014 ◽  
Vol 26 (4) ◽  
pp. 43201 ◽  
Author(s):  
王远 Wang Yuan ◽  
江孝国 Jiang Xiaoguo ◽  
陈思富 Chen Sifu ◽  
李杰 Li Jie ◽  
谢宇彤 Xie Yutong ◽  
...  
Keyword(s):  
Measurement System ◽  
High Speed ◽  
Beam Parameters ◽  
Parameters Measurement

scholarly journals Multifrequency Vector Measurement System for Reliable Vehicle Magnetic Profile Assessment

Sensors ◽  
2020 ◽  
Vol 20 (17) ◽  
pp. 4933 ◽  
Author(s):  
Zbigniew Marszalek ◽  
Krzysztof Duda
Keyword(s):  
Measurement System ◽  
Impedance Measurement ◽  
Operational Mode ◽  
Front End ◽  
Vector Measurement ◽  
Field Programmable ◽  
Excitation Frequencies ◽  
Magnetic Profile ◽  
Analogue To Digital ◽  
Parameters Measurement

This paper describes the design and the performance of simultaneous, multifrequency impedance measurement system for four inductive-loop (IL) sensors which have been developed for vehicle parameters measurement based on vehicle magnetic profile (VMP) analysis. Simultaneous impedance measurement on several excitation frequencies increases the VMP measurement reliability because typical electromagnetic interferences (EMI) are narrowband, and should not simultaneously affect, in the same way, all measurement bands that are spread in the frequency, i.e., it is expected that at least one measurement band is disturbance-free. The system consists of two standard and two slim IL sensors, specially designed and installed, the analogue front-end, and an industrial computer with digital-to-analogue and analogue-to-digital converters accessed via field-programmable gate array (FPGA). The impedance of the IL sensors is obtained by vector measurement of voltages from auto-balancing bridge (ABB) front-end. Complex voltages are demodulated from excitation frequencies with FIR filters designed with the flat-top windows. The system is capable of delivering VMPs in real-time mode, and also storing voltages for off-line postprocessing and analysis. Field distributions and sensitivities of slim and standard IL sensors are also discussed. Field test confirmed assumed increased reliability of VMP measurement for proposed simultaneous multifrequency operational mode.

Railway Geometric Parameters Measurement System Based on Videometrics

2010 ◽  
Vol 30 (11) ◽  
pp. 3203-3208
Author(s):  
伏思华 Fu Sihua ◽  
于起峰 Yu Qifeng ◽  
王明志 Wang Mingzhi ◽  
江和平 Jiang Heping ◽  
徐博泓 Xu Bohong
Keyword(s):  
Measurement System ◽  
Geometric Parameters ◽  
Parameters Measurement

Influence of high energy electron irradiation on beam parameters measurement system

2012 ◽  
Vol 24 (4) ◽  
pp. 949-952
Author(s):  
王远 Wang Yuan ◽  
谢宇彤 Xie Yutong ◽  
陈思富 Chen Sifu ◽  
江孝国 Jiang Xiaoguo ◽  
朱隽 Zhu Jun ◽  
...  
Keyword(s):  
Electron Irradiation ◽  
Measurement System ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
Beam Parameters ◽  
Parameters Measurement

Analog Circuit Parameters Measurement System Based on Multiplier

2014 ◽  
Vol 989-994 ◽  
pp. 3041-3044
Author(s):  
Yong Xi Wang ◽  
Mei Hu
Keyword(s):  
Measurement System ◽  
Analog Circuits ◽  
Analog Circuit ◽  
Signal Source ◽  
Simple Circuit ◽  
Labview Software ◽  
Phase Errors ◽  
Analog Signals ◽  
Lower Accuracy ◽  
Parameters Measurement

For the more complicated principles and the lower accuracy for the existing methods of the measurement of the analog circuit parameters, the paper constructs a measurement system for the analog circuits parameters based on the multiplier. The signal source generates two orthogonal sinusoidal analog signals with same frequency, and then one of the signals goes through the analog circuits. Then the multiplication and filtering are completed with the two DC signals. At last the phase and amplitude of the analog circuit are obtained through the DAQ and LabVIEW software. The amplitude and phase errors are less than 3%. The results show that the system has simple circuit, fast speed and high accuracy. So it is a feasible plan for the measurement system of the analog circuit parameters at present.

scholarly journals Application of Optimal Kalman Filter to Improve the Accuracy of Aircraft Wing Vibration Parameters Measurement System

2021 ◽  
Vol 2096 (1) ◽  
pp. 012182
Author(s):  
A A Afonin ◽  
A S Sulakov ◽  
M S Maamo
Keyword(s):  
Kalman Filter ◽  
Measurement System ◽  
Measurement Accuracy ◽  
Displacement Sensor ◽  
Aircraft Wing ◽  
System Operation ◽  
Basic Principles ◽  
Wing Vibration ◽  
Vibration Parameters ◽  
Parameters Measurement

Abstract This paper discusses the advantages of constructing a vibration parameters measurement system of an aircraft wing using mems IMUs. In addition to mems IMUs, the system makes use of displacement sensor and navigation system as secondary measurements, along with the optimal Kalman filter estimation. The basic principles of system operation are described. The main algorithms of the system and its errors mathematical model are presented. The results of simulation are presented, demonstrating the expected measurement accuracy of the system as a whole.

Pulsed I /V and S -parameters measurement system for isodynamic characterization of power GaN HEMT transistors

2018 ◽  
Vol 28 (8) ◽  
pp. e21515 ◽  
Author(s):  
Cristiano F. Gonçalves ◽  
Luís Cótimos Nunes ◽  
Pedro M. Cabral ◽  
José C. Pedro
Keyword(s):  
Measurement System ◽  
Gan Hemt ◽  
S Parameters ◽  
Parameters Measurement

Adaptive estimation of complex calibration residual errors of wafer-level S-parameters measurement system

2014 ◽  
Author(s):  
Aleksandr A. Savin ◽  
Vladimir G. Guba ◽  
Andrej Rumiantsev ◽  
Benjamin D. Maxson ◽  
Dirk Schubert ◽  
...  
Keyword(s):  
Measurement System ◽  
Adaptive Estimation ◽  
Wafer Level ◽  
S Parameters ◽  
Parameters Measurement ◽  
Residual Errors

Quartz Crystal Parameters Measurement System

1977 ◽  
Vol 26 (4) ◽  
pp. 300-304 ◽  
Author(s):  
Claude Pegeot ◽  
Jean-Jacques Gagnepain
Keyword(s):  
Measurement System ◽  
Quartz Crystal ◽  
Parameters Measurement
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