Analysis of excess carrier lifetime in p-type HgCdTe using a three-level Shockley–Read model
1992 ◽
Vol 10
(4)
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pp. 1560
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2007 ◽
Vol 46
(8A)
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pp. 5057-5061
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2012 ◽
Vol 51
(2R)
◽
pp. 028006
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Keyword(s):
Keyword(s):
2010 ◽
Vol 645-648
◽
pp. 207-210
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2012 ◽
Vol 51
◽
pp. 028006
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Keyword(s):
2013 ◽
Vol 440
◽
pp. 82-87
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2001 ◽
Vol 45
(12)
◽
pp. 1973-1978
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Keyword(s):