Growth Mode Diagram for the Epitaxial Growth on the Vicinal Surface of Strained Si (001)

Author(s):  
Pil Ryung Cha
2007 ◽  
Vol 124-126 ◽  
pp. 547-550
Author(s):  
Pil Ryung Cha

We present the linear stability analysis for the epitaxial thin film growth on the vicinal surface of strained Si and the growth mode diagrams of the epitaxial growth under various operation conditions. Competition between step-step elastic interactions and the asymmetry of incorporation of adatoms from the terraces to step edge is considered. Force monopoles at steps and their interaction lead to it on the vicinal surface while kinetic asymmetry of the adatom incorporation at steps due to Ehrlich-Schwoebel barrier prevents the step bunching instability. Growth mode on the vicinal surface is determined by the competition between elastic step-step interactions and Ehrlich-Schwoebel barrier.


2013 ◽  
Vol 103 (11) ◽  
pp. 111909 ◽  
Author(s):  
M. Vyshnepolsky ◽  
C. Klein ◽  
F. Klasing ◽  
A. Hanisch-Blicharski ◽  
M. Horn-von Hoegen

1986 ◽  
Vol 168 (1-3) ◽  
pp. 681-687 ◽  
Author(s):  
C. Fontaine ◽  
J.L. Castano ◽  
J. Castagné ◽  
A. Munoz-Yague

2010 ◽  
Vol 117 ◽  
pp. 55-61
Author(s):  
Masao Kamiko ◽  
Ryoichi Yamamoto

The effects of several surfactants on the homoepitaxial and heteroepitaxial growth of metallic films and multilayers have been studied and compared. Our measurements clearly revealed that pre-deposition of a small amount of surfactant prior to the adatom deposition changed thin film growth mode and structure. The pre-deposited surfactant enhanced layer-by-layer (LBL) growth of the homoepitaxial and heteroepitaxial growth of metallic films. The surfactant also enhanced the epitaxial growth of metallic multilayer.


2018 ◽  
Vol 924 ◽  
pp. 116-119 ◽  
Author(s):  
Shi Yang Ji ◽  
Ryoji Kosugi ◽  
Kazutoshi Kojima ◽  
Kazuhiro Mochizuki ◽  
Yasuyuki Kawada ◽  
...  

By mapping the source and HCl flow rates dependent growth rates, the evolving trend of a quasi-selective epitaxial growth (quasi-SEG) that growing very thin epilayer on mesa top and ensuring an extremely low risk of voids defect generation was firstly figured out on a 5-μm 4H-SiC trench. Then, basing on the acquired knowledge, a 25-μm 4H-SiC trench with an aspect ratio up to ~10 was completely filled in the quasi-SEG mode.


2010 ◽  
Vol 96 (14) ◽  
pp. 142501 ◽  
Author(s):  
M. A. I. Nahid ◽  
M. Oogane ◽  
H. Naganuma ◽  
Y. Ando

2006 ◽  
Vol 134 (2-3) ◽  
pp. 165-171 ◽  
Author(s):  
X.J. Ning ◽  
D. Gao ◽  
P. Bonfanti ◽  
H. Wu ◽  
J. Guo ◽  
...  

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