Elastic stiffness coefficients of thiourea from thermal diffuse scattering

The complete elastic stiffness tensor of thiourea has been determined from thermal diffuse scattering (TDS) using high-energy photons (100 keV). Comparison with earlier data confirms a very good agreement of the tensor coefficients. In contrast with established methods to obtain elastic stiffness coefficients (e.g. Brillouin spectroscopy, inelastic X-ray or neutron scattering, ultrasound spectroscopy), their determination from TDS is faster, does not require large samples or intricate sample preparation, and is applicable to opaque crystals. Using high-energy photons extends the applicability of the TDS-based approach to organic compounds which would suffer from radiation damage at lower photon energies.

Heat transfer analysis study for the design of the New Polychromatic Beam Neutron Reflectometer CANDOR (Chromatic Analysis Neutron Diffractometer Or Reflectometer)

A newly developed polychromatic beam neutron reflectometer CANDOR (Chromatic Analysis Neutron Diffractometer Or Reflectometer) on NG-1 at the NIST Center for Neutron research (NCNR) utilizes a wavelength-sensitive neutron detector consisting of 324 analyzing highly-oriented pyrolytic graphite (HOPG) crystals positioned sequentially in rows. Known for having a small thermal diffuse scattering cross section, HOPG crystals can lead to low signal-to-noise ratios in wavelength-sensitive detectors such as CANDOR. Even though it is possible to mathematically separate the desired signal from thermal diffuse scattering; by cooling the detector array of HOPG crystals in order to minimize the Debye Waller effect generates a better solution to this problem. In this heat transfer analysis study we show, within the instrument design constrains and thermodynamic considerations, technical feasibility and test results for the development of the New Polychromatic Beam Neutron Reflectometer CANDOR (Chromatic Analysis Neutron Diffractometer Or Reflectometer) at the NIST Center for Neutron Research.

Imaging and Diffraction with a Programmable Pixelated Detector

This chapter discusses the setup and use of a transmission electron detector in a typical scanning electron microscope (SEM). It describes the arrangement and function of the primary components in the detector, following the signal path from the sample to a micromirror array where it is directed by the user to either a CMOS sensor (to record diffraction patterns) or a photomultiplier tube (to observe real-space images). The chapter discusses some of the nuances of digital imaging and diffraction and includes examples in which transmission electron detectors are used to analyze gold films, carbon nanotubes, zeolite sheets, and monolayer graphene. It also describes emerging techniques, including four-dimensional STEM, thermal diffuse scattering, energy filtering, aberration correction, and atomic resolution imaging.