2008 26th International Conference on Microelectronics
Latest Publications

TOTAL DOCUMENTS

154

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781424418817

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Subthreshold performance of deep-submicrometer dual gate material p-MOSFET and CMOS circuits for ultra low power analog/mixed-signal applications

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559244 ◽

2008 ◽

Author(s):

Saurav Chakraborty ◽

Abhijit Mallik ◽

Chandan Kumar Sarkar

Keyword(s):

Low Power ◽

Cmos Circuits ◽

Ultra Low Power ◽

Mixed Signal ◽

Deep Submicrometer ◽

Dual Gate

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Reliability acceleration model of stacked ZrO2-Al2O3-ZrO2 MIM capacitor with cylinder type

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559337 ◽

2008 ◽

Cited By ~ 1

Author(s):

Jae Yong Seo ◽

Jung Eun Seok ◽

Hyun Joo kim ◽

Hyun Jung Kim ◽

Hong Sik Park ◽

...

Keyword(s):

Acceleration Model

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Modeling of nanoscale GaN FET in a compact 2-D model with gate stack effects

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559265 ◽

2008 ◽

Author(s):

Rajesh K. Tyagi ◽

Anil Ahlawat ◽

Manoj Pandey ◽

Sujata Pandey

Keyword(s):

Gate Stack ◽

D Model ◽

Gan Fet

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A comprehensive review of thermoelectric technology, micro-electrical and power generation properties

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559288 ◽

2008 ◽

Cited By ~ 11

Author(s):

C.A. Gould ◽

N.Y.A. Shammas ◽

S. Grainger ◽

I. Taylor

Keyword(s):

Power Generation ◽

Comprehensive Review

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A dynamic temperature mapping system with a 320x256 pixels frame size and 100kHz sampling rate

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559299 ◽

2008 ◽

Cited By ~ 1

Author(s):

M. Riccio ◽

G. Breglio ◽

A. Irace ◽

P. Spirito

Keyword(s):

Sampling Rate ◽

Frame Size ◽

Temperature Mapping ◽

Dynamic Temperature ◽

Mapping System

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Defects and relaxation during the negative bias temperature instability in PMOSFET

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559343 ◽

2008 ◽

Cited By ~ 1

Author(s):

C. Benard ◽

J-L. Ogier ◽

D. Goguenheim

Keyword(s):

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability

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Optimization of micro/nanooscillator parameters for analysis of transient adsorption processes

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559296 ◽

2008 ◽

Author(s):

Zoran G. Djuric ◽

Ivana M. Joki ◽

Milos P. Frantlovic

Keyword(s):

Adsorption Processes

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Input adapter based BiCMOS operational amplifier with rail-to-rail capability

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559306 ◽

2008 ◽

Author(s):

Niksa Tadic ◽

Mirjana Banjevic ◽

Franz Schloegl ◽

Horst Zimmermann

Keyword(s):

Operational Amplifier ◽

Rail To Rail

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Silicon based nano-MOSFET: New materials, new device architectures, and new challenges for device simulation

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559217 ◽

2008 ◽

Author(s):

Enrico Sangiorgi

Keyword(s):

Device Simulation ◽

New Materials ◽

New Device ◽

New Challenges ◽

Silicon Based ◽

Nano Mosfet

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Constant current tress characteristics of Ti doped Ta2O5 on silicon

2008 26th International Conference on Microelectronics ◽

10.1109/icmel.2008.4559352 ◽

2008 ◽

Cited By ~ 1

Author(s):

A. Skeparovski ◽

N. Novkovski ◽

A. Paskaleva ◽

E. Atanassova

Keyword(s):

Constant Current

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2008 26th International Conference on MicroelectronicsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Subthreshold performance of deep-submicrometer dual gate material p-MOSFET and CMOS circuits for ultra low power analog/mixed-signal applications

Reliability acceleration model of stacked ZrO2-Al2O3-ZrO2 MIM capacitor with cylinder type

Modeling of nanoscale GaN FET in a compact 2-D model with gate stack effects

A comprehensive review of thermoelectric technology, micro-electrical and power generation properties

A dynamic temperature mapping system with a 320x256 pixels frame size and 100kHz sampling rate

Defects and relaxation during the negative bias temperature instability in PMOSFET

Optimization of micro/nanooscillator parameters for analysis of transient adsorption processes

Input adapter based BiCMOS operational amplifier with rail-to-rail capability

Silicon based nano-MOSFET: New materials, new device architectures, and new challenges for device simulation

Constant current tress characteristics of Ti doped Ta2O5 on silicon

2008 26th International Conference on Microelectronics
Latest Publications