The bulk chemical composition of synrift sandstones and associated clayey rocks has been analized, and the distribution of the fields they form has been studied on discriminant paleogeodynamic SiO2K2O/Na2O [Roser, Korsch, 1986] and DF1DF2 [Verma, Armstrong-Altrin, 2013] diagrams. The studied sandstones in terms of bulk chemical composition mainly correspond to greywacke, lititic, arkose and subarkose psammites; Sublitites and quartz arenites are also found. A significant part in the analyzed data massif consists of psammites, in which log(Na2O/K2O)-1.0; missing on the Pettijohn classification chart. This confirms our conclusion, based on the results of mineralogical and petrographic studies, that the sedimentary infill of rift structures unites immature sandstones, the detrital framework of which was formed due to erosion of local sources, represented by various magmatic and sedimentary formations. Synrift clayey rocks, compared with sandstones, are composed of more mature fine-grained siliciclastics. As follows from the distribution of figurative data points of clayey rocks on the F1F2 diagram [Roser, Korsch, 1988], its sources were mainly sedimentary deposits. The content of most of the main rock-forming oxides in the synrift sandstones is almost the same as in silt-sandstone rocks present in the Upper Precambrian-Phanerozoic sedimentary mega-complex of the East European Plate, but at the same time differs significantly from the Proterozoic and Phanerozoic cratonic sediments, as well as from the average composition upper continental crust. It is shown that the distribution of the fields of syntift sandstones and clayey rocks on the SiO2K2O/Na2O diagram does not have any distinct features, and their figurative data points are localized in the areas of terrigenous rocks of passive and active continental margins. On the DF1DF2 diagram, the fields of the studied psammites and clayey rocks are located in areas of riftogenous and collisional environments. We have proposed a different position of the border between these areas in the diagram, which will require further verification.