2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Latest Publications

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(FIVE YEARS 0)

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Published By IEEE

9781509053131

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

ReRAM ON/OFF resistance ratio degradation due to line resistance combined with device variability in 28nm FDSOI technology

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962594 ◽

2017 ◽

Cited By ~ 2

Author(s):

H. Aziza ◽

P. Canet ◽

J. Postel-Pellerin ◽

M. Moreau ◽

J.-M. Portal ◽

...

Keyword(s):

Resistance Ratio ◽

Line Resistance

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Is there a kink effect in FDSOI MOSFETs?

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962564 ◽

2017 ◽

Cited By ~ 3

Author(s):

H. J. Park ◽

M. Bawedin ◽

K. Sasaki ◽

J-A. Martino ◽

S. Cristoloveanu

Keyword(s):

Kink Effect

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The MSET as an IC building block

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962602 ◽

2017 ◽

Cited By ~ 1

Author(s):

Assaf Peled ◽

Yossi Rosenwaks ◽

Ofer Amrani

Keyword(s):

Building Block

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Sensitivity analysis of C-V global variability for 28 nm FD-SOI

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962582 ◽

2017 ◽

Cited By ~ 1

Author(s):

Krishna Pradeep ◽

Thierry Poiroux ◽

Patrick Scheer ◽

Gilles Gouget ◽

Andre Juge ◽

...

Keyword(s):

Sensitivity Analysis ◽

28 Nm

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Layer thickness impact on Second Harmonic Generation characterization of SOI wafers

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962557 ◽

2017 ◽

Author(s):

D. Damianos ◽

I. Ionica ◽

J. Changala ◽

M. Lei ◽

A. Kaminski-Cachopo ◽

...

Keyword(s):

Second Harmonic Generation ◽

Layer Thickness ◽

Harmonic Generation ◽

Second Harmonic

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Compact modeling of intrinsic capacitances in Double-Gate Tunnel-FETs

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962584 ◽

2017 ◽

Cited By ~ 3

Author(s):

A. Farokhnejad ◽

M. Graef ◽

F. Horst ◽

C. Liu ◽

Q.T. Zhao ◽

...

Keyword(s):

Compact Modeling ◽

Double Gate ◽

Tunnel Fets

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Improved analog performance of SOI Nanowire nMOSFETs Self-Cascode through back-biasing

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962607 ◽

2017 ◽

Cited By ~ 1

Author(s):

R. Assalti ◽

M. de Souza ◽

M. Casse ◽

S. Barraud ◽

G. Reimbold ◽

...

Keyword(s):

Analog Performance ◽

Self Cascode

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Author list

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962555 ◽

2017 ◽

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A reliable high performance nano SOI MOSFET by considering quadruple silicon zones

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962563 ◽

2017 ◽

Author(s):

Meysam Zareiee ◽

Milad Abtin

Keyword(s):

High Performance ◽

Soi Mosfet

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Flexible piezoelectric transducers based on a PMMA/ZnO nanowire composite

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ◽

10.1109/ulis.2017.7962558 ◽

2017 ◽

Cited By ~ 1

Author(s):

R. Tao ◽

G. Ardila ◽

M. Parmar ◽

L. Michaud ◽

M. Mouis

Keyword(s):

Piezoelectric Transducers ◽

Zno Nanowire

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2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

ReRAM ON/OFF resistance ratio degradation due to line resistance combined with device variability in 28nm FDSOI technology

Is there a kink effect in FDSOI MOSFETs?

The MSET as an IC building block

Sensitivity analysis of C-V global variability for 28 nm FD-SOI

Layer thickness impact on Second Harmonic Generation characterization of SOI wafers

Compact modeling of intrinsic capacitances in Double-Gate Tunnel-FETs

Improved analog performance of SOI Nanowire nMOSFETs Self-Cascode through back-biasing

Author list

A reliable high performance nano SOI MOSFET by considering quadruple silicon zones

Flexible piezoelectric transducers based on a PMMA/ZnO nanowire composite

2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
Latest Publications